XAFS Studies of Diluted Magnetic Semiconductors Zn1-xMxS (M = Mn, Co)

X-ray absorption near edges structure -S) spectra of the Diluted Magnetic Semiconductors @MS) system Zn,&S (M=Mn, CO) have been measured at the M n and CO L,,>-edge using sample current mode. Analysis of the M L3,2-edge XANES spectra for Zn,.&S revealed the presence of a white line feature in each series, whose intensity increased linearly with concentration X. The white line feature is assigned to M 2p,, and 2p, photoelectron excitations to nonbonding 3d(e) states and to the relatively broadened band of M 3d(Q S 3p hybridized antibonding states. The rate of increase of white line intensity with X is associated with the difference in the degree ofpd hybridization of states between M 3d and S 3p.